Знание языков
Հայերեն
English
Русский
Українська
Публикации
Статья
Results of Validation Analysis for Multi-Memory Bus BIST Engines
2024
1-3 էջ
Статья
Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs
2024
1-6 էջ
Статья
An Approach for Increasing Memory Repair Efficiency
2024
1-6
Статья
LEARNING METHODOLOGY FOR VALIDATION OF MEMORY BIST SOLUTIONS VIA A SHARED INTERFACE
2024
69-76
Статья
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata
2023
49-60
Статья
Functional Safety Compliant Test & Repair Framework for System-on-Chip Lifecycle Management
2021
7-17
Статья
Polynomial algorithm for equivalence problem of deterministic multitape finite automata
2020
120-132
Статья
Memory Physical Aware Multi-Level Fault Diagnosis Flow
2020
700-711
Статья
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism
2019
562-575
Статья
Experimental study on Hamming and Hsiao Codes in the Context of Embedded Applications
2017
25-28
Статья
Automated Flow for Test Pattern Creation for IPs in SoC
2017
21-24
Статья
An Efficient Testing Methodology for Embedded Flash Memories
2017
422-425
Статья
Security Issues in Test and Repair Infrastructure for Systems-on-Chip
2017
114-122
Конференция
An efficient approach for memory repair by reducing the number of spares.
Конференция
Extending fault periodicity table for testing faults in memories under 20nm.
Конференция
A power based memory BIST grouping methodology.
Конференция
Overview study on fault modeling and test methodology development for FinFET-based memories.
Конференция
Securing Test Infrastructure of System-on-Chips
Конференция
Armenia: Communicating to World Community in Electronic Test and Design
Патент
Testing Electronic Memories Based on Fault and Test Algorithm Periodicity