Статья On an Approach to Data Integration: Concept, Formal Foundations and Data Model Manuk G. Manukyan 2017 206-213
Статья Experimental study on Hamming and Hsiao Codes in the Context of Embedded Applications S. Shoukourian G. Harutyunyan G. Tshagharyan Y. Zorian 2017 25-28
Статья Automated Flow for Test Pattern Creation for IPs in SoC S. Shoukourian G. Harutyunyan D. Sargsyan Y. Zorian 2017 21-24
Статья An Efficient Testing Methodology for Embedded Flash Memories S. Shoukourian G. Harutyunyan S. Martirosyan Y. Zorian 2017 422-425
Статья Security Issues in Test and Repair Infrastructure for Systems-on-Chip S. Shoukourian G. Harutyunyan G. Tshagharyan 2017 114-122
Статья ИНСТРУМЕНТАЛЬНАЯ СРЕДА ДЛЯ ПРЕДСТАВЛЕНИЯ И ОБРАБОТКИ НЕЧЕТКИХ ЗНАНИЙ И ЕЕ ПРИЛОЖЕНИЯ А. Г. Костанян Т. Г. Демирчян 2017 150-157
Конференция An efficient approach for memory repair by reducing the number of spares. Vrezh Sargsyan Valery A. Vardanian Samvel K. Shoukourian Yervant Zorian Avetik Yessayan
Конференция Extending fault periodicity table for testing faults in memories under 20nm. Gurgen Harutyunyan Samvel K. Shoukourian Valery A. Vardanian Yervant Zorian
Конференция A power based memory BIST grouping methodology. Lusine Martirosyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian
Конференция Overview study on fault modeling and test methodology development for FinFET-based memories. Grigor Tshagharyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian
Конференция Securing Test Infrastructure of System-on-Chips S. Shoukourian G.Tshagharyan G.Harutynyan Y.Zorin
Конференция Armenia: Communicating to World Community in Electronic Test and Design Samvel Shoukourian Yuri Shoukourian Vladimir Sahakyan
Патент Testing Electronic Memories Based on Fault and Test Algorithm Periodicity S. Shoukourian G. Harutyunyan V. Vardanian A. Hakhumyan Y. Zorian