Article On an Approach to Data Integration: Concept, Formal Foundations and Data Model Manuk G. Manukyan 2017 206-213
Article Experimental study on Hamming and Hsiao Codes in the Context of Embedded Applications S. Shoukourian G. Harutyunyan G. Tshagharyan Y. Zorian 2017 25-28
Article Automated Flow for Test Pattern Creation for IPs in SoC S. Shoukourian G. Harutyunyan D. Sargsyan Y. Zorian 2017 21-24
Article An Efficient Testing Methodology for Embedded Flash Memories S. Shoukourian G. Harutyunyan S. Martirosyan Y. Zorian 2017 422-425
Article Security Issues in Test and Repair Infrastructure for Systems-on-Chip S. Shoukourian G. Harutyunyan G. Tshagharyan 2017 114-122
Article 袠袧小孝袪校袦袝袧孝袗袥鞋袧袗携 小袪袝袛袗 袛袥携 袩袪袝袛小孝袗袙袥袝袧袠携 袠 袨袘袪袗袘袨孝袣袠 袧袝效袝孝袣袠啸 袟袧袗袧袠袡 袠 袝袝 袩袪袠袥袨袞袝袧袠携 袗. 袚. 袣芯褋褌邪薪褟薪 孝. 袚. 袛械屑懈褉褔褟薪 2017 150-157
Conference An efficient approach for memory repair by reducing the number of spares. Vrezh Sargsyan Valery A. Vardanian Samvel K. Shoukourian Yervant Zorian Avetik Yessayan
Conference Extending fault periodicity table for testing faults in memories under 20nm. Gurgen Harutyunyan Samvel K. Shoukourian Valery A. Vardanian Yervant Zorian
Conference A power based memory BIST grouping methodology. Lusine Martirosyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian
Conference Overview study on fault modeling and test methodology development for FinFET-based memories. Grigor Tshagharyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian
Conference Securing Test Infrastructure of System-on-Chips S. Shoukourian G.Tshagharyan G.Harutynyan Y.Zorin
Conference Armenia: Communicating to World Community in Electronic Test and Design Samvel Shoukourian Yuri Shoukourian Vladimir Sahakyan
Patent Testing Electronic Memories Based on Fault and Test Algorithm Periodicity S. Shoukourian G. Harutyunyan V. Vardanian A. Hakhumyan Y. Zorian