Գիտաժողովի նյութ An efficient approach for memory repair by reducing the number of spares. Valery A. Vardanian Samvel K. Shoukourian Vrezh Sargsyan Avetik Yessayan Yervant Zorian 2015 21-25
Գիտաժողովի նյութ A power based memory BIST grouping methodology. Gurgen Harutyunyan Samvel K. Shoukourian Lusine Martirosyan Yervant Zorian 2015 27-30
Գիտաժողովի նյութ Overview study on fault modeling and test methodology development for FinFET-based memories. Gurgen Harutyunyan Samvel K. Shoukourian Grigor Tshagharyan Yervant Zorian 2015 19-22
Գիտաժողովի նյութ Fault Collapsing For Digital Circuits Based On Relations Between Stuck-At Faults V. Vardanian T. Grigoryan H. Malkhasyan G. Mushyan 2015 15-18
Գիտաժողովի նյութ Extending fault periodicity table for testing faults in memories under 20nm. Gurgen Harutyunyan Samvel K. Shoukourian Valery A. Vardanian Yervant Zorian 2014 5-9